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Symptoms

You run Secure Digital (SD) Bus Level Functional Tests on a MultiMediaCard (MMC) Plus card that is connected to a Windows Embedded Compact 7-based device. When you do this, certain subtests may fail with insufficient information to find the failure cause. These subtests include 1029, 1030, 1031, and 1032. 

SubTest ID

Description

1029

Simple synchronous test of CMD24 (WRITE_BLOCK).

1030

Simple asynchronous test of CMD24 (WRITE_BLOCK).

1031

Simple synchronous test of CMD25 (WRITE_MULTIPLE_BLOCK).

1032

Simple asynchronous test of CMD25 (WRITE_MULTIPLE_BLOCK).


Resolution

Software update information

A supported software update is now available from Microsoft as Windows Embedded Compact 7 Monthly Update January 2012. In the "File information" section, the package file name contains the processor type.

Note This Windows Embedded Compact 7 monthly update is available for download from the following Microsoft Download Center website:

Windows Embedded Compact 7 Updates

Prerequisites

This update is supported only if all previously issued updates for this product have also been installed.

Restart requirement

After you apply this update, you must perform a clean build of the whole platform. To do this, use one of the following methods:

  • On the Build menu, click Clean Solution, and then click Build Solution.

  • On the Build menu, click Rebuild Solution.

You do not have to restart the computer after you apply this software update.

Update replacement information

This update does not replace any other updates.

Binary build information

Building a binary is an optional step and is applicable only if you want to build the binary manually. By default, the binary is updated when you apply this update.

To build a binary manually, follow these steps:

  1. In Microsoft Visual Studio, create a new OS design project.

  2. Select the BSP (CPU architecture) directory for which you want to build a binary.

  3. Select a design template such as Portable Media Player or Handheld.

  4. On the Build menu, click Open Release Directory in the Build window.

  5. In the Build window, locate your Test folder. For example, locate the following folder:

    C:\WINCE700\PRIVATE\TEST

  6. At a command prompt, type Build -c, and then press Enter. When the build is complete, the test binaries are copied to the following folder:

    C:\WINCE700\PUBLIC\TEST\OAK\TARGET

  7. Select the CPU folder that you chose in step 2.

  8. Copy the built test files to the Windows Embedded Compact Test Kit (CTK) installation location. For example, copy the files to the following location:

    path:\Program Files\Windows Embedded Compact Test Kit\tests\target\CPU\retailNote The path placeholder represents the root directory where the CTK is installed, and the CPU placeholder represents the directory that you chose in step 2.


File information

The English version of this software update package has the file attributes (or later file attributes) that are listed in the following table. The dates and times for these files are listed in Coordinated Universal Time (UTC). When you view the file information, it is converted to local time. To find the difference between UTC and local time, use the Time Zone tab in the Date and Time item in Control Panel.

Files that are included in this update package

File name

File size

Date

Time

Path

Drv_tst_busreq.cpp

201,619

21-Dec-2011

19:34

Private\Test\Baseos\Drivers\Sdcard\Sd\Driver

Sdtst.dll

312,368

21-Dec-2011

19:19

Public\Test\Oak\Target\Armv5\Retail

Sdtst.map

384,735

21-Dec-2011

19:19

Public\Test\Oak\Target\Armv5\Retail

Sdtst.rel

63,190

21-Dec-2011

19:19

Public\Test\Oak\Target\Armv5\Retail

Sdtst.dll

312,368

21-Dec-2011

19:22

Public\Test\Oak\Target\Armv6\Retail

Sdtst.map

386,067

21-Dec-2011

19:22

Public\Test\Oak\Target\Armv6\Retail

Sdtst.rel

63,451

21-Dec-2011

19:22

Public\Test\Oak\Target\Armv6\Retail

Sdtst.dll

312,368

21-Dec-2011

19:25

Public\Test\Oak\Target\Armv7\Retail

Sdtst.map

386,067

21-Dec-2011

19:25

Public\Test\Oak\Target\Armv7\Retail

Sdtst.rel

63,451

21-Dec-2011

19:25

Public\Test\Oak\Target\Armv7\Retail

Sdtst.dll

345,136

21-Dec-2011

19:27

Public\Test\Oak\Target\Mipsii\Retail

Sdtst.map

384,501

21-Dec-2011

19:27

Public\Test\Oak\Target\Mipsii\Retail

Sdtst.rel

213,120

21-Dec-2011

19:27

Public\Test\Oak\Target\Mipsii\Retail

Sdtst.dll

345,136

21-Dec-2011

19:29

Public\Test\Oak\Target\Mipsii_fp\Retail

Sdtst.map

385,116

21-Dec-2011

19:29

Public\Test\Oak\Target\Mipsii_fp\Retail

Sdtst.rel

213,787

21-Dec-2011

19:29

Public\Test\Oak\Target\Mipsii_fp\Retail

Sdtst.dll

295,984

21-Dec-2011

19:31

Public\Test\Oak\Target\Sh4\Retail

Sdtst.map

384,468

21-Dec-2011

19:31

Public\Test\Oak\Target\Sh4\Retail

Sdtst.rel

96,424

21-Dec-2011

19:31

Public\Test\Oak\Target\Sh4\Retail

Sdtst.dll

287,792

21-Dec-2011

19:33

Public\Test\Oak\Target\X86\Retail

Sdtst.map

385,786

21-Dec-2011

19:33

Public\Test\Oak\Target\X86\Retail

Sdtst.rel

65,307

21-Dec-2011

19:33

Public\Test\Oak\Target\X86\Retail

References

For more information about the Secure Digital (SD) Bus Level Functional Tests, visit the following Microsoft Developer Network (MSDN) website:

SD Bus Level Functional Tests (Windows Embedded Compact 7)For more information about the Windows Embedded Compact Test Kit (CTK) , visit the following Microsoft TechNet website:

Compact Test Kit (CTK) Portal (Windows Embedded Compact 7)For more information about software update terminology, click the following article number to view the article in the Microsoft Knowledge Base:

824684 Description of the standard terminology that is used to describe Microsoft software updates

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